Visualization of Electrons Localized in Metal-Oxide-Nitride-Oxide-Semiconductor Flash Memory Thin Gate Films by Detecting High-Order Nonlinear Permittivity Using Scanning Nonlinear Dielectric Microscopy

スポンサーリンク

概要

• 論文の詳細を見る
• 2012-03-25

著者

• Honda Koichiro

  RIEC, Tohoku University

• Cho Yasuo

  RIEC, Tohoku University

関連論文

• Visualization of Electrons Localized in Metal-Oxide-Nitride-Oxide-Semiconductor Flash Memory Thin Gate Films by Detecting High-Order Nonlinear Permittivity Using Scanning Nonlinear Dielectric Microscopy

スポンサーリンク