A new probe design combining finite element method and optimization used for vertical probe card in wafer probing

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概要

• 論文の詳細を見る
• 2009-10-01

著者

• Chang Dar-yuan

  Department Of Mechanical Engineering Chinese Culture University

• CHIU Jinn-Tong

  Department of Mechanical Engineering, De Lin Institute of Technology

• Chiu Jinn-tong

  Department Of Mechanical Engineering De Lin Institute Of Technology

関連論文

• A new probe design combining finite element method and optimization used for vertical probe card in wafer probing
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