X-ray micro tomography and image analysis as complementary methods for morphological characterization and coating thickness measurement of coated particles
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概要
- 論文の詳細を見る
- 2010-11-01
著者
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Van De
Skyscan Nv
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PERFETTI Giacomo
NanoStructured Materials Group, DelftChemTech DCT, Delft University of Technology
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RIEGER Bernd
Quantitative Imaging Group, Department of Imaging Science and Technology, Delft University of Techno
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WILDEBOER Willem
DSM Food Specialties
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MEESTERS Gabrie
NanoStructured Materials Group, DelftChemTech DCT, Delft University of Technology
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Rieger Bernd
Quantitative Imaging Group Department Of Imaging Science And Technology Delft University Of Technolo
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Meesters Gabrie
Nanostructured Materials Group Delftchemtech Dct Delft University Of Technology
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Perfetti Giacomo
Nanostructured Materials Group Delftchemtech Dct Delft University Of Technology