Sequential Locally Optimum Test (SLOT) : A Sequential Detection Scheme Based on Locally Optimum Test Statistic

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概要

• 論文の詳細を見る

• Based on the characteristics of the thresholds of two detection schemes employing locally optimum test statistics, a sequential detection design procedure is proposed and analyzed. The proposed sequential test, called the sequential locally optimum test (SLOT), inherently provides finite stopping time (terminates with probability one within the finite horizon), and thereby avoids undesirable forced termination. The performance of the SLOT is compared with that of the fixed sample-size test, sequential probability ratio test (SPRT), truncated SPRT, and 2-SPRT. It is observed that the SLOT requires smaller average sample numbers than other schemes at most values of the normalized signal amplitude while maintaining the error performance close to the SPRT.

• （社）電子情報通信学会の論文
• 2010-11-01

著者

• Yoon Seokho

  Sungkyunkwan Univ. Suwon Kor

• Song Iickho

  Korea Advanced Inst. Of Sci. And Technol. Daejeon Kor

• Kim Yun

  Kyung Hee Univ. Gyeonggi‐do Kor

• Kim Yun

  Kyung Hee University

• Park Seong

  Qualcomm

• BAE Jinsoo

  Sejong University

• OH Jongho

  Korea Advanced Institute of Science and Technology

• OH Seong-Jun

  Korea University

• Song Iickho

  Korea Advanced Institute Of Science And Technology

• Bae Jinsoo

  Sejong Univ. Kor

• Yoon Seokho

  Sungkyunkwan Univ. Seoul Kor

• Yoon Seokho

  Sungkyunkwan University

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