Analysis of Errors in Permittivity Measurements Using the Waveguide-Penetration Method

概要

論文の詳細を見る
The Waveguide-Penetration method is a permittivity measurement technique where a columnar object pierces a rectangular waveguide through a pair of holes at the center of its broad walls. The permittivity of the object is estimated from measured S-parameters. This paper demonstrates a scheme for analyzing permittivity measurement errors in the Waveguide-Penetration method. The sources of errors are categorized into systematic and random error sources. Systematic errors in the values of the sample and waveguide holes diameters, the effect of samples length, and the influence of ambient temperature are investigated and corrected for. Potential random error sources such as imperfect TRL calibration elements, VNA thermal noise, sample loading, and test-port cable flexure are analyzed and their contribution to random errors are estimated.
（社）電子情報通信学会の論文
2010-07-01