Statistical interferometric investigation of nano-scale root growth : effects of short-term ozone exposure on ectomycorrhizal pine (Pinus densiflora) seedlings

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概要

• 論文の詳細を見る
• 2007-12-01

著者

• Toyooka Satoru

  Graduate School of Science and Engineering, Saitama University

• Toyooka Satoru

  Graduate School Of Science And Engineering Saitama University

• Rathnayake Anura

  Graduate School Of Science And Engineering Saitama University

• Miwa Makoto

  Graduate School Of Science And Engineering Saitama University

• KADONO Hirofumi

  Graduate School of Science and Engineering, Saitama University

• Kadono Hirofumi

  Graduate School Of Science And Engineering Saitama University

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• Rewritable Broad-Band Color Filters for Spectral Image Analysis
• Statistical interferometric investigation of nano-scale root growth : effects of short-term ozone exposure on ectomycorrhizal pine (Pinus densiflora) seedlings
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• Digital Speckle Pattern Interferometry for Observing the Entire Process of Plastic Deformation of a Solid Object
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