Intra-Die Spatial Correlation Extraction with Maximum Likelihood Estimation Method for Multiple Test Chips
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概要
- 論文の詳細を見る
- 2009-12-01
著者
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Fu Qiang
State Key Lab. Of Asic & System Microelectronics Dept. Fudan University
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ZENG Xuan
State Key Lab. of ASIC & System, MOE Key Lab. for Computational Physical Sciences, Fudan University
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TAO Jun
State Key Lab. of ASIC & System, MOE Key Lab. for Computational Physical Sciences, Fudan University
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CAI Wei
Department of Mathematics, University of North Carolina at Charlotte
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Zeng Xuan
State Key Lab. Of Asic & System Moe Key Lab. For Computational Physical Sciences Microelectronic
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LUK Wai-Shing
State Key Lab. of ASIC & System, MOE Key Lab. for Computational Physical Sciences, Fudan University
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Tao Jun
State Key Lab. Of Asic & System Moe Key Lab. For Computational Physical Sciences Microelectronic
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Luk Wai-shing
State Key Lab. Of Asic & System Microelectronics Dept. Fudan University
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Cai Wei
Department Of Mathematics University Of North Carolina At Charlotte
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Cai Wei
Department of Applied Physics, Beihang University, Beijing 100191, China
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