Degradation Analysis of Blue Phosphorescent Organic Light Emitting Diode by Impedance Spectroscopy and Transient Electroluminescence Spectroscopy
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概要
- 論文の詳細を見る
We carried out degradation analysis of a blue phosphorescent organic light emitting diode by both impedance spectroscopy and transient electroluminescence (EL) spectroscopy. The number of semicircles observed in the Cole-Cole plot of the modulus became three to two after the device was operated for 567 hours. Considering the effective layer thickness of the initial and degraded devices did not change by degradation and combining the analysis of the Bode-plot of the imaginary part of the modulus, the relaxation times of emission layer and hole-blocking with electron transport layers changed to nearly the same value by the increase of the resistance of emission layer. Decay time of transient EL of the initial device was coincident with that of the degraded one. These phenomena suggest that no phosphorescence quenching sites are generated in the degraded device, but the number of the emission sites decrease by degradation.
- (社)電子情報通信学会の論文
- 2009-11-01
著者
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Kawamura Yuichiro
Idemitsu Kosan Co. Ltd.
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KUMA Hitoshi
Idemitsu Kosan Co., Ltd.
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Kuma Hitoshi
Idemitsu Kosan Co. Ltd.
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OGIWARA Toshinari
Idemitsu Kosan Co., Ltd.
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TAKAHASHI Jun-ichi
Idemitsu Kosan Co., Ltd.
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IWAKUMA Toshihiro
Idemitsu Kosan Co., Ltd.
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HOSOKAWA Chishio
Idemitsu Kosan Co., Ltd.
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Hosokawa Chishio
Idemitsu Kosan Co. Ltd.
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Iwakuma Toshihiro
Idemitsu Kosan Co. Ltd.
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Ogiwara Toshinari
Idemitsu Kosan Co. Ltd.
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Takahashi Jun-ichi
Idemitsu Kosan Co. Ltd.
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- Degradation Analysis of Blue Phosphorescent Organic Light Emitting Diode by Impedance Spectroscopy and Transient Electroluminescence Spectroscopy