High Speed 1.1-μm-Range InGaAs-Based VCSELs
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概要
- 論文の詳細を見る
We have developed InGaAs-based VCSELs operating around 1.1µm for high-speed optical interconnections. By applying GaAsP barrier layers, temperature characteristics were considerably improved compared to GaAs barrier layers. As a result, 25Gbps 100°C error-free operation was achieved. These devices also exhibited high reliability. No degradation was observed over 3, 000 hours under operation temperature of 150°C and current density of 19kA/cm2. We also developed VCSELs with tunnel junctions for higher speed operation. High modulation bandwidth of 24GHz and a relaxation oscillation frequency of 27GHz were achieved. 40Gbps error-free operation was also demonstrated.
- (社)電子情報通信学会の論文
- 2009-07-01
著者
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Tsuji Masayoshi
Nano-electronics Res. Labs. Nec Corporation
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Anan Takayoshi
Nano-electronics Res. Labs. Nec Corporation
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Tokutome Keiichi
Nano-electronics Res. Labs. Nec Corporation
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Suzuki Naofumi
Nano-electronics Res. Labs. Nec Corporation
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HATAKEYAMA Hiroshi
Nano-Electronics Res. Labs., NEC Corporation
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FUKATSU Kimiyoshi
Nano-Electronics Res. Labs., NEC Corporation
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YASHIKI Kenichiro
Nano-Electronics Res. Labs., NEC Corporation
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AKAGAWA Takeshi
Nano-Electronics Res. Labs., NEC Corporation
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Yashiki Kenichiro
Nano-electronics Res. Labs. Nec Corporation
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Hatakeyama Hiroshi
Nano-electronics Res. Labs. Nec Corporation
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Fukatsu Kimiyoshi
Nano-electronics Res. Labs. Nec Corporation
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Akagawa Takeshi
Nano-electronics Res. Labs. Nec Corporation