Non-destructive Depth Profiling of the Activated Ti-Zr-V Getter by Means of Excitation Energy Resolved Photoelectron Spectroscopy
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概要
著者
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Pis Igor
Department Of Surface And Plasma Science Faculty Of Mathematics And Physics Charles University
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PAVLUCH Jiri
Department of Surface and Plasma Science, Faculty of Mathematics and Physics, Charles University
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ZOMMER Ludomir
Institute of Physical Chemistry, Polish Academy of Sciences
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MASEK Karel
Department of Surface and Plasma Science, Faculty of Mathematics and Physics, Charles University
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SKALA Tomas
Sincrotrone Trieste SCpA
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SUTARA Frantisek
Department of Surface and Plasma Science, Faculty of Mathematics and Physics, Charles University
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NEHASIL Vaclav
Department of Surface and Plasma Science, Faculty of Mathematics and Physics, Charles University
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POLYAK Yaroslav
J. Heyrovsky Institute of Physical Chemistry, Czech Academy of Sciences
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Masek Karel
Department Of Surface And Plasma Science Faculty Of Mathematics And Physics Charles University
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Pavluch Jiri
Department Of Surface And Plasma Science Faculty Of Mathematics And Physics Charles University
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Zommer Ludomir
Institute Of Physical Chemistry Polish Academy Of Sciences
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Polyak Yaroslav
J. Heyrovsky Institute Of Physical Chemistry Czech Academy Of Sciences
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Nehasil Vaclav
Department Of Surface And Plasma Science Faculty Of Mathematics And Physics Charles University
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Sutara Frantisek
Department Of Surface And Plasma Science Faculty Of Mathematics And Physics Charles University