SEM Electron Channeling Contrast Imaging of Dislocation Structures in Fatigued [017] Cu Single Crystals Oriented for Critical Double Slip
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概要
- 論文の詳細を見る
- 2010-05-01
著者
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GUO Wei-Wei
Institute of Materials Physics and Chemistry, College of Sciences, Northeastern University
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WANG Xiao-Meng
Institute of Materials Physics and Chemistry, College of Sciences, Northeastern University
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LI Xiao-Wu
Institute of Materials Physics and Chemistry, College of Sciences, Northeastern University
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Guo Wei-wei
Institute Of Materials Physics And Chemistry College Of Sciences Northeastern University
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Wang Xiao-meng
Institute Of Materials Physics And Chemistry College Of Sciences Northeastern University
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Li Xiao-wu
Institute Of Materials Physics And Chemistry College Of Sciences Northeastern University
関連論文
- SEM electron channeling contrast imaging of dislocation structures in fatigued Cu single crystals oriented for critical double slip
- SEM Electron Channeling Contrast Imaging of Dislocation Structures in Fatigued [017] Cu Single Crystals Oriented for Critical Double Slip
- Compressive Deformation Behaviors of Coarse- and Ultrafine-Grained Pure Titanium at Different Temperatures : A Comparative Study