Heat- and electron-beam-induced transport of gold particles into silicon oxide and silicon studied by in situ high-resolution transmission electron microscopy
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概要
- 論文の詳細を見る
- 2008-06-01
著者
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Falk Fritz
Institute Of Photonic Technologies
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Kaiser Ute
Electron Microscopy Group Of Materials Science University Of Ulm
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BISKUPEK Johannes
Electron Microscopy Group of Materials Science, University of Ulm
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Biskupek Johannes
Electron Microscopy Group Of Materials Science University Of Ulm
関連論文
- Matrix-dependent structure of GeSi nanocrystals in SiC
- Heat- and electron-beam-induced transport of gold particles into silicon oxide and silicon studied by in situ high-resolution transmission electron microscopy