A Method for Compensating Multiple-Reflection Effect in Measurement of Electro-Optic Coefficient
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概要
- 論文の詳細を見る
- 2009-02-01
著者
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UMEGAKI Shinsuke
Faculty of Science and Technology, Keio University, Hiyoshi
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Liu Xin
Faculty Of Science And Technology Keio University
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IWAMURA Tomo
Faculty of Science and Technology, Keio University
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SUKA Shota
Faculty of Science and Technology, Keio University
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Suka Shota
Faculty Of Science And Technology Keio University
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Iwamura Tomo
Faculty Of Science And Technology Keio University
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Umegaki Shinsuke
Faculty Of Science And Technology Keio University
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