Direct Confirmation of the High Coherency of the Electron Beam from a Nanotip

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概要

• 論文の詳細を見る

• The coherency of an electron beam from a nanotip was evaluated and compared to that from a tungsten (110) oriented tip by using nano-biprisms in a field-emission projection microscope (FPM). The FPM images were consistent with the corresponding field emission patterns of the employed tip. The nanotip generated much sharper biprism interference patterns than the W(110) tip, and comparison of the visibilities of interference patterns demonstrated directly that a highly coherent electron beam was emitted from the nanotip.

• 2008-07-25

著者

• Ishikawa Tsuyoshi

  Kagami Memorial Laboratory For Material Science And Technology Waseda University

• Oshima Chuhei

  Kagami Memorial Laboratory For Material Science And Technology Waseda University

• Oshima Chuhei

  Kagami Memorial Institute For Material Science And Technologies Waseda University

• Rokuta Eiji

  Kagami Memorial Laboratory For Material Science And Technology Waseda University

• Cho Boklae

  Kagami Memorial Laboratory for Material Science and Technology, Waseda University, 2-8-26 Nishi-wase

• Cho Boklae

  Kagami Memorial Laboratory For Material Science And Technology Waseda University

• Isikawa Tsuyoshi

  Kagami Memorial Laboratory for Material Science and Technology, Waseda University

関連論文

• Phonon Density of States of Pseudomorphic fcc-Fe Film(Condensed Matter : Structure, Mechanical and Thermal Properties)
• High Resolution Field Emission Spectra from Niobium (100) Tip Surface(APFIM/FIM)
• Direct Confirmation of the High Coherency of the Electron Beam from a Nanotip

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