Effect of temperature and film thickness on resistivity of CoWP
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概要
- 論文の詳細を見る
- 2007-09-19
著者
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Gambino J.
Ibm Microelectronics
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CHEN F.
IBM Microelectronics
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MONGEON S.
IBM Microelectronics
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MEATYARD D.
IBM Microelectronics
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ADAMS E.
IBM Microelectronics
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DEHAVEN P.
IBM Microelectronics
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CABRAL C.
IBM Thomas J.
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IVANOV I.
Blue29 LLC