The Effect of Radical Oxidation on DRAM Cell Transistor with S-RCAT
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概要
- 論文の詳細を見る
- 2007-09-19
著者
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Kim Ji
Sam-sung Electronic Corporation Dram Process Architecture Team
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PARK Se
Sam-Sung Electronic Corporation, DRAM Process Architecture Team
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JOE Sung
Sam-Sung Electronic Corporation, DRAM Process Architecture Team
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SONG Hyun
Sam-Sung Electronic Corporation, DRAM Process Architecture Team
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CHOI Ik
Sam-Sung Electronic Corporation, DRAM Process Architecture Team
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HAN Sang
Sam-Sung Electronic Corporation, DRAM Process Architecture Team
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AHN Yong
Sam-Sung Electronic Corporation, DRAM Process Architecture Team
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PARK Soon
Sam-Sung Electronic Corporation, DRAM Process Architecture Team
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LEE Jong
Sam-Sung Electronic Corporation, DRAM Process Architecture Team
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KIM Se
Sam-Sung Electronic Corporation, DRAM Process Architecture Team
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CHOI Won
Sam-Sung Electronic Corporation, DRAM Process Architecture Team
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KIM Ki
Sam-Sung Electronic Corporation, DRAM Process Architecture Team
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OH Kyoung
Sam-Sung Electronic Corporation, DRAM Process Architecture Team
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Choi Ik
Sam-sung Electronic Corporation Dram Process Architecture Team
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Joe Sung
Sam-sung Electronic Corporation Dram Process Architecture Team
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Kim Ki
Sam-sung Electronic Corporation Dram Process Architecture Team
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Park Soon
Sam-sung Electronic Corporation Dram Process Architecture Team
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Park Se
Sam-sung Electronic Corporation Dram Process Architecture Team
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Han Sang
Sam-sung Electronic Corporation Dram Process Architecture Team
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Ahn Yong
Sam-sung Electronic Corporation Dram Process Architecture Team
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Oh Kyoung
Sam-sung Electronic Corporation Dram Process Architecture Team
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Kim Se
Sam-sung Electronic Corporation Dram Process Architecture Team
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Choi Won
Sam-sung Electronic Corporation Dram Process Architecture Team
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Song Hyun
Sam-sung Electronic Corporation Dram Process Architecture Team