Re-examination of 1/f Noise in FD-SOI for Practical Usage of Analog Circuits
スポンサーリンク
概要
- 論文の詳細を見る
- 2006-09-13
著者
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Miura Noriyuki
Semiconductor R&d Division Oki Electric Industry Co. Ltd.
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Kumar Anil
Semiconductor R&d Division Oki Electric Industry Co. Ltd.
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Ida Jiro
Semiconductor R&d Division Oki Electric Industry Co. Ltd.
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Kita Yukihiro
Semiconductor R&d Division Oki Electric Industry Co. Ltd.
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DOMAE Yasuhiro
Semiconductor R&D Division, Oki Electric Industry Co. Ltd.
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OKAMURA Tomohiro
Semiconductor R&D Division, Oki Electric Industry Co. Ltd.
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KOMATSUBARA Hirotaka
Semiconductor R&D Division, Oki Electric Industry Co. Ltd.
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Komatsubara Hirotaka
Semiconductor R&d Division Oki Electric Industry Co. Ltd.
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Domae Yasuhiro
Semiconductor R&d Division Oki Electric Industry Co. Ltd.
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Okamura Tomohiro
Semiconductor R&d Division Oki Electric Industry Co. Ltd.