Ultra-thin Oxide Lifetime Projection and Comparison of nFET and pFET for 90nm/65nm Application
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概要
- 論文の詳細を見る
- 2006-09-13
著者
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Lin Cheng-li
Q&ra Division United Microelectronics Corporation (umc) No. 3
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LIN Cheng-Li
Q&RA Division, United Microelectronics Corporation (UMC) No. 3
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KAO Tom
Q&RA Division, United Microelectronics Corporation (UMC) No. 3
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CHEN Ju-Ping
Q&RA Division, United Microelectronics Corporation (UMC) No. 3
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SHIEH Jerry
Q&RA Division, United Microelectronics Corporation (UMC) No. 3
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SU K.
Q&RA Division, United Microelectronics Corporation (UMC) No. 3
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Kao Tom
Q&ra Division United Microelectronics Corporation (umc) No. 3
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Shieh Jerry
Q&ra Division United Microelectronics Corporation (umc) No. 3
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Chen Ju-ping
Q&ra Division United Microelectronics Corporation (umc) No. 3