Analysis of Trap-Parameter Dependence of Lag Phenomena and Current Collapse in GaN FETs
スポンサーリンク
概要
- 論文の詳細を見る
- 2005-09-13
著者
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TAKAYANAGI H.
Faculty of Systems Engineering, Shibaura Institute of Technology
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NAKANO H.
Faculty of Systems Engineering, Shibaura Institute of Technology
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ITAGAKI K.
Faculty of Systems Engineering, Shibaura Institute of Technology
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HORIO K.
Faculty of Systems Engineering, Shibaura Institute of Technology
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Itagaki K.
Faculty Of Systems Engineering Shibaura Institute Of Technology