Study of Temperature Effect on Low V_T State Behavior of NBit Cells
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概要
- 論文の詳細を見る
- 2005-09-13
著者
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Zous N.
Technology Development Center Macronix International Co. Ltd.
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Lu Chih-yuan
Technology Development Center Macronix International Co. Ltd.
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CHEN Evelyn
Technology Development Center, Macronix International Co., Ltd.
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CHEN K.
Technology Development Center, Macronix International Co., Ltd.
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HUANG Ijen
Technology Development Center, Macronix International Co., Ltd.
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LIU Lenvis
Technology Development Center, Macronix International Co., Ltd.
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CHEN Y.
Technology Development Center, Macronix International Co., Ltd.
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CHEN Sam
Technology Development Center, Macronix International Co., Ltd.
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CHEN M.
Technology Development Center, Macronix International Co., Ltd.
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HO L.
Technology Development Center, Macronix International Co., Ltd.
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LU W.
Technology Development Center, Macronix International Co., Ltd.
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TING Wenchi
Technology Development Center, Macronix International Co., Ltd.
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KU Joseph
Technology Development Center, Macronix International Co., Ltd.
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WENG Andy
Technology Development Center, Macronix International Co., Ltd.
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LIOU H.
Technology Development Center, Macronix International Co., Ltd.
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Chen Sam
Technology Development Center Macronix International Co. Ltd.
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Weng Andy
Technology Development Center Macronix International Co. Ltd.
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Ku Joseph
Technology Development Center Macronix International Co. Ltd.
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Liu Lenvis
Technology Development Center Macronix International Co. Ltd.
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Huang Ijen
Technology Development Center Macronix International Co. Ltd.
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Chen Evelyn
Technology Development Center Macronix International Co. Ltd.
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Ting Wenchi
Technology Development Center Macronix International Co. Ltd.
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Chen Y.
Technology Development Center Macronix International Co. Ltd.
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Liou H.
Technology Development Center Macronix International Co. Ltd.