Study of charge quantization in individual silicon quantum dots using Kelvin Probe Force Microscopy
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概要
- 論文の詳細を見る
- 2004-09-15
著者
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MIZUTA H.
Department of Physical Electronics, Tokyo Institute of Technology
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ODA S.
Quantum Nanoelectronics Research Centre, Tokyo Institute of Technology
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Salem M.
Quantum Nanoelectronics Research Center Tokyo Institute Of Technology
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Usami K.
Department Of Physical Electronics And Quantum Nanoelectronics Research Center Tokyo Institute Of Te
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TSUCHIYA Y.
Quantum Nanoelectronics Research Center, Tokyo Institute of Technology
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USAMI K.
Quantum Nanoelectronics Research Center, Tokyo Institute of Technology
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Mizuta H.
Department Of Physical Electronics And Quantum Nanoelectronics Research Center Tokyo Institute Of Te
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TSUCHIYA Y.
Department of Physical Electronics and Quantum Nanoelectronics Research Center, Tokyo Institute of Technology
関連論文
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- Study of charge quantization in individual silicon quantum dots using Kelvin Probe Force Microscopy