The wrap-around problem and optimal padding in the exit wave reconstruction using HRTEM images
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概要
- 論文の詳細を見る
- 2006-08-01
著者
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Chen F.
Department Of Engineering And System Science National Tsing-hua University Center For Electron Micro
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Chen F.
Department Of Engineering And System Science National Tsing Hua University
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LIN F.
Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University
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CHEN Q.
Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University
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TANG D.
FEI Company
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PENG L.-M.
Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University
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Peng L.-m.
Key Laboratory For The Physics And Chemistry Of Nanodevices And Department Of Electronics Peking University
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