Design of Plane-Symmetric Low F-number Reflective System Based on Perturbation Aberration Model
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概要
- 論文の詳細を見る
- 2007-12-01
著者
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Nakano Takayuki
Information Technology R&d Center Mitsubishi Electric Corporation
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TAMAGAWA Yasuhisa
Information Technology R&D Center, Mitsubishi Electric Corporation
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Tamagawa Yasuhisa
Information Technology R&d Center Mitsubishi Electric Corporation
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Tamagawa Yasuhisa
Information Technology R & D Center Mitsubishi Electric Corporation
関連論文
- Design of Plane-Symmetric Low F-number Reflective System Based on Perturbation Aberration Model
- Design of an Athermalized Hybrid Single Lens in the 3-5μm Wavelength Band