Microstructure of Ge:Ta_2O_5 Granular Thin Films : an Application of TEM-Tomography
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概要
- 論文の詳細を見る
- Japan Institute of Metalsの論文
- 2007-10-01
著者
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Gao Hongye
Department Of Applied Quantum Physics And Nuclear Engineering Kyushu University
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Ohnuma Shigehiro
Research Institute For Electric And Magnetic Materials
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MATSUMURA Syo
Department of Nuclear Engineering, Faculty of Engineering, Kyusyu Uiversity
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Matsumura Syo
Department Of Applied Quantum Physics And Nuclear Engineering Faculty Of Engineering Kyushu Universi
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TOH Shoichi
Research Laboratory for HVEM, Kyushu University
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ABE Seishi
Research Institute for Electric and Magnetic Materials
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Toh Shoichi
Research Laboratory For Hvem Kyushu University
関連論文
- Recent Development in Quantitative Electron Diffraction for Crystallography of Materials
- Microstructure of Ge:Ta_2O_5 Granular Thin Films : an Application of TEM-Tomography
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- High Angular Resolution Electron Channeling X-ray Spectroscopy for Radiation-Induced Local Disordering in Magnesium Aluminate Spinel Compounds
- Ordered Structures and Phase States in Epitaxial Layers of III-V Semiconductor Alloys
- Higher order Laue zone patterns in convergent beam electron diffraction and determinations of local lattice parameters in .ALPHA.- and .ALPHA.2-phases of a Cu-20at%Al alloy.