Tail Electron Hydrodynamic Model for Consistent Modeling of Impact Ionization and Gate Injection
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概要
- 論文の詳細を見る
- 1995-08-21
著者
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Ahn Jae-gyung
Ulsi Laboratory Lg Semicon Co. Ltd.
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PARK Young-June
Department. of Elec. Eng. and ISRC, Seoul Nat'l. University
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MIN Hong-Shick
Department. of Elec. Eng. and ISRC, Seoul Nat'l. University
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Min Hong-shick
Department. Of Elec. Eng. And Isrc Seoul Nat'l. University
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Park Young-june
Department. Of Elec. Eng. And Isrc Seoul Nat'l. University
関連論文
- Electrical Characteristics of Ultra Short Channel CMOS Device for Giga-bit DRAM Applications
- Tail Electron Hydrodynamic Model for Consistent Modeling of Impact Ionization and Gate Injection