Comparison of Over Erase Susceptibility and Cycling Reliability between Channel Erase and Bitline Erase in Flash EEPROM

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概要

• 論文の詳細を見る
• 1995-08-21

著者

• Hsu Jen-tai

  Memory Product Division National Semiconductor Corporation

• SHUMWAY Stuart

  Memory Product Division, National Semiconductor Corporation

• Shumway Stuart

  Memory Product Division National Semiconductor Corporation

関連論文

• Comparison of Over Erase Susceptibility and Cycling Reliability between Channel Erase and Bitline Erase in Flash EEPROM

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