Intrinsic Stress and Misfit Relaxation Ge/Si(001)
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概要
- 論文の詳細を見る
- 1998-09-07
著者
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Walz J.
Institut Fur Experimentalphysik Freie Universitat Berlin
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WEDLER G.
Institut fur Experimentalphysik, Freie Universitat Berlin
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HESJEDAL T.
Paul-Drude-Institut fur Festkorperelektronik
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CHILLA E.
Paul-Drude-Institut fur Festkorperelektronik
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KOCH R.
Institut fur Experimentalphysik, Freie Universitat Berlin
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Wedler G.
Institut Fur Experimentalphysik Freie Universitat Berlin
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Koch R.
Institut Fur Experimentalphysik Freie Universitat Berlin
関連論文
- Intrinsic Stress and Misfit Relaxation Ge/Si(001)
- Bottom-up approach for the nanopatterning of Si(001)