Structural Origin of Carrier Trap Levels at SiO_2/Si Interface
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概要
- 論文の詳細を見る
- 1998-09-07
著者
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Hattori T.
Department Of Electrical & Electronic Engineering Musashi Institute Of Technology
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Nohira H.
Department Of Electrical & Electronic Engineering Musashi Institute Of Technology
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WATANABE N.
Department of Electrical & Electronic Engineering, Musashi Institute of Technology
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OMURA A.
Department of Electrical & Electronic Engineering, Musashi Institute of Technology
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- Structural Origin of Carrier Trap Levels at SiO_2/Si Interface