RF Noise Study of Small Gate Width Si-MOSFETs up to 8GHz Application for Low Power Consumption

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概要

• 論文の詳細を見る
• 1998-09-07

著者

• Ohguro T.

  Toshiba Corporation

• MORIFUJI E.

  Toshiba Corporation

• BIBER C.

  Swiss Federal Institute of Technology (ETH)

• BACHTOLD W.

  Swiss Federal Institute of Technology (ETH)

• YOSHITOMI T.

  Toshiba Corporation

• KIMIJIMA H.

  Toshiba Corporation

• MORIMOTO T.

  Toshiba Corporation

• MOMOSE H.

  Toshiba Corporation

• KATSUMATA Y.

  Toshiba Corporation

• IWAI H.

  Toshiba Corporation

関連論文

• RF Noise Study of Small Gate Width Si-MOSFETs up to 8GHz Application for Low Power Consumption
• A High Performance 0.15μm Single Gate CMOS Technology

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