Effect of Energy Dependence of Primary Beam Divergence on the X-ray Standing Wave Characterization of Layered Materials
スポンサーリンク
概要
著者
-
Lodha G.
Synchrotron Utilization Division Centre For Advanced Technology
-
TIWARI M.
Synchrotron Utilization Division, Centre for Advanced Technology
-
NAIK S.
Synchrotron Utilization Division, Centre for Advanced Technology
-
NANDEDKAR R.
Synchrotron Utilization Division, Centre for Advanced Technology
-
Nandedkar R.
Synchrotron Utilization Division Centre For Advanced Technology
-
Naik S.
Synchrotron Utilization Division Centre For Advanced Technology
-
Tiwari M.
Synchrotron Utilization Division Centre For Advanced Technology
関連論文
- Sample Preparation for Evaluation of Detection Limits in X-ray Fluorescence Spectrometry
- Effect of Energy Dependence of Primary Beam Divergence on the X-ray Standing Wave Characterization of Layered Materials