Novel Methods to Incorporate Deuterium in the MOS Structures and Isotope Effects on Soft Breakdown and Interface States

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概要

• 論文の詳細を見る
• 2001-09-25

著者

• Lee M.

  Dept. Of Electrical Engineering National Taiwan University

• LIN C.-H.

  Dept. of Electrical Engineering, National Taiwan University

• HSU B.-C.

  Dept. of Electrical Engineering, National Taiwan University

• LIU C.

  Dept. of Electrical Engineering, National Taiwan University

• Hsu B.-c.

  Dept. Of Electrical Engineering National Taiwan University

• Lin C.-h.

  Dept. Of Electrical Engineering National Taiwan University

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