Non-destructive Rapid Analysis of Brominated Flame Retardants in Electrical and Electronic Equipment Using Raman Spectroscopy
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概要
- 論文の詳細を見る
- 2004-08-10
著者
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Kurosawa Masaru
Technical Laboratory Analysis Center Co. Ltd.
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KIKUCHI Sonoko
Analysis Division, Fujitsu Analysis Laboratory Ltd.
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KAWAUCHI Kazuteru
Application & Research Center, JEOL Ltd.
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HONJHO Hisashi
Technical Laboratory, Analysis Center Co., Ltd.
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YAGISHITA Teruo
Nanotechnology Business Creation Initiative
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OOKI Sadatsugu
Application & Research Center, JEOL Ltd.
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Honjho Hisashi
Technical Laboratory Analysis Center Co. Ltd.
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Kikuchi Sonoko
Analysis Division Fujitsu Analysis Laboratory Ltd.
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Kawauchi Kazuteru
Application & Research Center Jeol Ltd.
関連論文
- Non-destructive Rapid Analysis Discriminating between Chromium(VI) and Chromium(III) Oxides in Electrical and Electronic Equipment Using Raman Spectroscopy
- Non-destructive Rapid Analysis of Brominated Flame Retardants in Electrical and Electronic Equipment Using Raman Spectroscopy