Fluctuation microscopy : a probe of atomic correlations in disordered materials
スポンサーリンク
概要
- 論文の詳細を見る
- Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
- 2000-04-01
著者
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Gibson J.
Argonne National Laboratory
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VOYLES P.
Department of Physics, University of Illinois
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TREACY M.
NEC Research Institute
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Voyles P.
Department Of Physics University Of Illinois
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Voyles P.M.
Department of Physics, University of Illinois
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Gibson J.M.
Argonne National Laboratory
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Treacy M.M.J.
NEC Research Institute