Direct observation of a stacking fault in Si_<1-x>Ge_x semiconductors by spherical aberration-corrected TEM and conventional ADF-STEM
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概要
- 論文の詳細を見る
- 2004-04-01
著者
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Yamasaki Jun
Center For Integrated Research In Science And Engineering
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Tanaka Nobuo
Center For Integrated Research In Science And Engineering
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KAWAI Tomoyuki
Department of Physics and CREST-JST, Tokyo Institute of Technology
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KAWAI Tomoyuki
EcoTopia Science Institute and Department of Crystalline Materials Science, Nagoya University
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Kawai Tomoyuki
Department Of Crystalline Materials Science Nagoya University
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KAWAI Tomoyuki
Department of Chemical Pharmacology, Faculty of Pharmaceutical Sciences, Nagoya City University
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- Direct observation of a stacking fault in Si_Ge_x semiconductors by spherical aberration-corrected TEM and conventional ADF-STEM
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