Delay Fault Testing for CMOS Iterative Logic Arrays with a Constant Number of Patterns

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概要

• 論文の詳細を見る
• 2003-12-01

著者

• Lu Shyue-kung

  Department Of Electronic Engineering Fu Jen Catholic University

• Lu Shyue-kung

  Department Of Electronic Engineering Fu-jen Catholic University

関連論文

• Defect Level Prediction Using Multi-Model Fault Coverage(Dependable Computing)
• Delay Fault Testing for CMOS Iterative Logic Arrays with a Constant Number of Patterns

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