Critical Path Selection for Deep Sub-Micron Delay Test and Timing Validation
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概要
- 論文の詳細を見る
- 2003-12-01
著者
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Cheng Kwang-ting(tim)
Department Of Ece University Of California
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Liou Jing-jia
Department Of Ee National Tsing-hua University
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WANG Li-C.
Department of ECE, University of California
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KRSTIC Angela
Department of ECE, University of California
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CHENG Kwang-Ting
Department of ECE, University of California
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Wang Li-c.
Department Of Ece University Of California
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Krstic Angela
Department Of Ece University Of California
関連論文
- Recent Advances in Analog, Mixed-Signal, and RF Testing
- Critical Path Selection for Deep Sub-Micron Delay Test and Timing Validation(Timing Verification and Test Generation)(VLSI Design and CAD Algorithms)
- Critical Path Selection for Deep Sub-Micron Delay Test and Timing Validation