AgX写真システムとそのミクロ成分の特性測定に対する低温分析電子顕微鏡の応用
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概要
著者
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Howe J
Department Of Materials Science & Engineering 116 Engineer's Way University Of Virginia
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Howe James
Department Of Materials Science And Engineering University Of Virginia
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OLESHKO Vladimir
Department of Materials Science & Engineering, 116 Engineer's Way, University of Virginia
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Oleshko Vladimir
Department Of Materials Science & Engineering 116 Engineer's Way University Of Virginia
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HOWE James
Department of Materials Science & Engineering, 116 Engineer's Way, University of Virginia
関連論文
- Effects of heat and electron irradiation on the melting behavior of Al-Si alloy particles and motion of the Al nanosphere within
- AgX写真システムとそのミクロ成分の特性測定に対する低温分析電子顕微鏡の応用
- Application of valence electron energy-loss spectroscopy and plasmon energy mapping for determining material properties at the nanoscale