An Accurate Characterization of CRT Monitor (II) Proposal for an Extension to CIE Method and Its Verification
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概要
- 論文の詳細を見る
- 2001-10-01
著者
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BERNS Roy
Munsell Color Science Laboratory, Chester F. Carlson Center for Imaging Science, Rochester Institute
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Berns Roy
Munsell Color Science Laboratory Chester F. Carlson Center For Imaging Science Rochester Institute O
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Berns Roy
Munsell Color Science Laboratory Center For Imaging Science Rochester Inst. Of Tech.
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KATOH Naoya
PNC Development Center, Sony Corporation
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DEGUCHI Tatsuya
PNC Development Center, Sony Corporation
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Katoh Naoya
Pnc Development Center Sony Corporation
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Deguchi Tatsuya
Pnc Development Center Sony Corporation
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