HREM study of ion implantation in 6H-SiC at high temperatures

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概要

• 論文の詳細を見る
• Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
• 1997-08-01

著者

• VAN TENDELOO

  EMAT, University of Antwerp (RUCA)

• LEBEDEV O.

  EMAT, University of Antwerp (RUCA)

• Suvorov A.

  Cree Research Inc.

• SUVOROVA A.

  Ioffe Physical-Technical Institute

• USOV I.

  Ioffe Physical-Technical Institute

• Lebedev O.

  Emat University Of Antwerp (ruca)

• Lebedev O.I.

  EMAT, University of Antwerp (RUCA)

• Suvorova A.A.

  Ioffe Physical-Technical Institute

関連論文

• Structure determination of YBCO fluorinated phases by HREM
• Microstructure of Mn-doped, spin-cast FeSi_2
• Structural phase transition in the manganite Nd_Ca_Sr_MnO_
• Microstructure and phase transitions in Pb(Sc_Ta_)O_3
• HREM study of ion implantation in 6H-SiC at high temperatures
• Microstructure of Cu_xMo_6S_8 Chevrel phase thin films on R-plane sapphire
• Modulated structures in KAlSi_3O_8: a study by high resolution electron microscopy and ^Si MAS-NMR spectroscopy

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