Simulation of Electron Trajectories of Wien Filter for High-Resolution EELS Installed in TEM

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概要

• 論文の詳細を見る
• Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
• 1996-10-01

著者

• TSUNO Katsushige

  JEOL Ltd.

• Rouse John

  Munro's Electron Beam Software Ltd.

関連論文

• Magnetic-Field-Free Objective Lens around a Specimen for Observing Fine Structure of Ferromagnetic Materials in a Transmission Electron Microscope
• High Magnification Observation of Magnetic Domains by Means of a High Voltage Scanning Electron Microscope
• Simulation of Electron Trajectories of Wien Filter for High-Resolution EELS Installed in TEM

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