Development of Flaching System for Field Emitter of FE Gun for HVEM
スポンサーリンク
概要
- 論文の詳細を見る
- Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
- 1995-02-01
著者
-
Arai S
Center For Integrated Research In Science And Engineering Nagoya University
-
Morita Chizuko
Department Of Microbiology Osaka Medical College
-
Yokoi Naoki
Electron Optics Laboratory School Of Engineering Nagoya University
-
Morita C
Center For Integrated Research In Science And Engineering Nagoya University
-
Shimoyama H
Department Of Electrical And Electronic Engineering Faculty Of Science And Technology Meijo Universi
-
Shimoyama Hiroshi
Department Of Electrical And Electronic Engineering Faculty Of Engineering Shinshu University
-
ENOMOTO Yoshio
Information and Electronic Laboratories, Furukawa Electric Co., Ltd
-
MIYAUCHI Kyoichi
Beam Technology Center, Instrument Division, Hitachi, Ltd
-
ONAI Toshio
Beam Technology Center, Instrument Division, Hitachi, Ltd
-
MORITA Chiaki
Electron Optics Laboratory, School of Engineering, Nagoya University
-
ARAI Shigeo
Electron Optics Laboratory, School of Engineering, Nagoya University
-
ENOMOTO Yoshio
Infomation and Electron Laboratories, The Fukukawa Electric Co. Ltd.
-
Enomoto Y
Information And Electronic Laboratories Furukawa Electric Co. Ltd
-
Onai Toshio
Beam Technology Center Instrument Division Hitachi Ltd
-
Miyauchi Kyoichi
Beam Technology Center Instrument Division Hitachi Ltd
-
Shimoyama Hiroshi
Department Of Electrical And Eiectronic Engineering Faculty Of Science And Technology Meijo Universi
関連論文
- An improved procedure of electron microscopic in situ hybridization for detecting adenovirus DNA
- Optical Emission Spectra during Carbon Nanotube Production by Arc Discharge in H_2, CH_4 or He Gas
- Theoretical Model and Device Performance of CuInS_2 Thin Film Solar Cell
- Photosynthetic Activity Measurement of Plants Using Photoacoustic Spectroscopy Combined with Confocal Scanning Microscopy (Special Issue on Organic Molecular Electronics for the 21st Century)
- Localized electron irradiation methods and their application to detection of flow-field of point defects
- Development of remote control and monitoring system for the FE qun in HVEM
- Development of battery charging system for the FE gun system of HVEM
- Optimization of Operating Conditions for the FE Gun System of HVEM
- Dependence of Aberration Coefficients of Triode Field Emission Gun on Electrode Geometries for Accelerating and Decelerating Modes
- Development of Flaching System for Field Emitter of FE Gun for HVEM
- Improvement and Application of Intermittent Electron Irradiation Technique with a High Voltage Electron Microscope
- A new evaluation method of electron optical performance of high beam current probe forming systems
- The Mean Brightness of the Electron Microscope Gun
- Relativistic Considerations on Electron Optical Brightness
- A Comparison of Thermionic Emission Current Density and Brightness Evaporation Loss for LaB_6 and Tungsten
- Theory of cathode trajectory characterization by canonical mapping transformation
- Morphology and infectivity of virus that persistently caused infection in an AGS cell line