Scanning electron microscopy study of failure in glass-sealed SiC/SiC-based composite(NUSK-CMC)creep tested at 1100 and 1200℃ in air

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概要

• 論文の詳細を見る
• 2001-12-01

著者

• Davies I.

  Advanced Fibro-science Kyoto Institute Of Technology

• OGASAWARA T.

  Structures Division, National Aerospace Laboratory

• ISHIKAWA T.

  Structures Division, National Aerospace Laboratory

関連論文

• Scanning electron microscopy study of failure in glass-sealed SiC/SiC-based composite(NUSK-CMC)creep tested at 1100 and 1200℃ in air

スポンサーリンク