Characterization of the Oxidized β-Si_3N_4 Whisker Surface Layer Using XPS and TOF-SIMS
スポンサーリンク
概要
著者
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Nakabayashi Ichiro
The University Of Tokushima Faculty Of Engineering
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Nakagawa Hamazo
Ube Scientific Analysis Laboratory Inc.
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TOKUSE Masahiro
UBE Scientific Analysis Laboratory, Inc.
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OYAMA Ryuji
UBE Scientific Analysis Laboratory, Inc.
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Oyama Ryuji
Ube Scientific Analysis Laboratory Inc.
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Tokuse Masahiro
Ube Scientific Analysis Laboratory Inc.
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Nakabayashi I
The University of Tokushima, Faculty of Engineering
関連論文
- Structural Characterization of Lead Titanate Film Synthesized by Hydrothermal Method
- Influence of Diameter on the Raman Spectra of Multi-Walled Carbon Nanotubes
- Characterization of the Oxidized β-Si_3N_4 Whisker Surface Layer Using XPS and TOF-SIMS