Simulation of Monolithic Silicon LLL Scanning X-Ray Interferometer

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概要

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• A model of a monolithic silicon LLL scanning X-ray interferometer capable of displacements up to 100 µm is described. It can be used for the measurement of the $(2\bar{2}0)$ lattice plane spacing of silicon in studies concerning the Avogadro constant and for the calibration of linear displacement transducers having sub-nanometer sensitivity.

• Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
• 1997-08-15

著者

• Mana Giovanni

  Istituto Di Metrologia"g.colonnetti" C.n.r.

• Bianc Giuseppe

  Dipartimento di Fisica Generale “A. Avogadro”, Università di Torino, via P. Giuria 1, 10125

• Zosi Gianfranco

  Dipartimento di Fisica Generale “A. Avogadro”, Università di Torino, via P. Giuria 1, 10125

• Bertolotto Bianc

  Dipartimento Di Fisica Generale"a.avogadro" Universita Di Torino

• Zosi Gianfranco

  Dipartimento Di Fisica Generale"a.avogadro" Universita Di Torino

関連論文

• Simulation of Monolithic Silicon LLL Scanning X-Ray Interferometer

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