Comparative Role of Metal-Organic Decomposition-Derived [100] and [111] in Electrical Properties of Pb(Zr, Ti)O3 Thin Films
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概要
- 論文の詳細を見る
The effect of composition (phase), texture, microstructure and thickness on electrical properties of Pb(Zr1- xTi x)O3 (PZT) films have been evaluated. Zr-rich PZT films with [111] texture have a higher remanent polarization and dielectric constant, but a lower coercive field as compared with PZT[100] films. Ti-rich PZT films with [100] texture have a higher dielectric constant, but a lower remanent polarizalion and coercive field as compared with PZT[111] films. Near the morphotropic phase boundary (MPB) composition, films with a mixed texture of [111] and [100] have a higher dielectric constant than PZT[100] and PZT[111] films even though the values of remanent polarization and coercive field of the mixed textured films are in between those of the other two films. Both remanent and saturation polarization are independent of film thickness, whereas dielectric constant decreases but coercive field increases at very small thickness.
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 1997-07-15
著者
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Chen I-wei
Department Of Materials Science And Engineering University Of Pennsylvania
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Chen I-wei
Department Of Materials Sicence And Engineering The University Of Michigan
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Chen S‐y
National Chiao‐tung Univ. Hsinchu Twn
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Chen San-Yuan
Institute of Materials Science and Engineering, National Chiao-Tung University, Hsinchu 300, Taiw
関連論文
- Resistance Switching of Al/(Pr, Ca)MnO_3 Thin Films
- Comparative Role of Metal-Organic Decomposition-Derived [100] and [111] in Electrical Properties of Pb(Zr, Ti)O3 Thin Films
- Resistance Switching of Al/(Pr,Ca)MnO3 Thin Films