蛍光X線法による微量元素分析とイメージング
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概要
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X-ray fluorescence analysis has a long history as a conventional bulk elemental analysis with medium sensitivity. However, with the use of synchrotron radiation x-ray fluorescence method has become a unique analytical technique which can provide trace elemental information with the spatial resolution. To obtain quantitative information of trace elemental distribution by using the x-ray fluorescence method, theoretical description of x-ray fluorescence yield is described. Moreover, methods and instruments for trace characterization with a scanning x-ray microprobe are described.
- 日本放射光学会の論文
- 2000-08-31