Quantification of Sulfur in Copper by Secondary Ion Mass Spectrometry(SIMS)
スポンサーリンク
概要
著者
-
Nakada Yoshinobu
Central Research Institute Mitsubishi Materials Corporation
-
MINE Kazuhisa
Central Research Institute, Mitsubishi Materials Corporation
-
KOUTSUKA Toshimoto
Central Research Institute, Mitsubishi Materials Corporation
-
SASSA Koichi
Central Research Institute, Mitsubishi Materials Corporation
-
Sassa Koichi
Central Research Institute Mitsubishi Materials Corporation
-
Mine Kazuhisa
Central Research Institute Mitsubishi Materials Corporation
-
Koutsuka Toshimoto
Central Research Institute Mitsubishi Materials Corporation
-
Nakada Yoshinobu
Central Research Institute, Mitsubishi Materials Corporation
関連論文
- Nitridation of Gaps (001) Surface Studied by Auger Electron Spectroscopy
- Nitridation of GaAs(001) Surface Studied by Auger Electron Spectroscopy
- Energy Shifts of Auger Transitions of Ga, As and N during Plasma-assisted Nitridation of GaAs (001) Surface
- Quantification of Sulfur in Copper by Secondary Ion Mass Spectrometry(SIMS)
- Scanning Transmission Electron Microscopy and Electron Energy Loss Spectroscopy at 1,000kV