Effect of The Boundary of the Interface on the Oscillation Mode in the Three-Phases Liquid Membrane System
スポンサーリンク
概要
著者
-
GOHSHI Yohichi
National Institute for Environmental Studies
-
Gohshi Y
National Institute For Environmental Studies
-
Miyamura K
Sci. Univ. Tokyo Tokyo
-
YOSHIHISA Hiroshi
Course of Applied Chemistry, Graduate School of Engineering, The University of Tokyo
-
SUTOU Shunkichi
Course of Applied Chemistry, Graduate School of Engineering, The University of Tokyo
-
MIYAMURA Kazuo
Course of Applied Chemistry, Graduate School of Engineering, The University of Tokyo
-
GOHSHI Yohichi
Course of Applied Chemistry, Graduate School of Engineering, The University of Tokyo
-
Sutou Shunkichi
Course Of Applied Chemistry Graduate School Of Engineering The University Of Tokyo
-
Yoshihisa Hiroshi
Course Of Applied Chemistry Graduate School Of Engineering The University Of Tokyo
-
Gohshi Yohichi
Course Of Applied Chemistry Graduate School Of Engineering The University Of Tokyo
関連論文
- Data Processing for Obtaining Atomic Images from SrTiO_3 X-Ray Fluorescence Hologram
- Atomic-Resolution X-Ray Fluorescence Holography of Zn(0.02wt%)in a GaAs Wafer
- X-Ray Fluorescence Holography of SrTiO_3 Compared with X-Ray Photoelectron Holography
- Analysis of Contamination Layer of InP During LPE Process by Synchrotron Radiation-Excited X-Ray Fluorescence : Surfaces, Interfaces and Films
- Chemical State Mapping by X-Ray Fluorescence Using Absorption Edge Shifts : Techniques, Instrumentations and Measurement
- Characterization of Co-O Thin Films by X-Ray Fluorescence Using Chemical Shifts of Absorption Edges
- Determination of the Mass Resolution and the Depth Resolution of Time of Flight Elastic Recoil Detection Analysis Using Heavy Ion Beams
- lmproverment in the Detection Limits of Elastic Recoil Detection Analysis (ERDA)Using a Time-of-Flight Detection
- Inelastic Mean Free Path of Photoelectrons in Ag Determined by Total Reflection X-Ray Photoelectron Spectroscopy
- X-Ray Absorption and Photoelectron Spectroscopies Using Total Reflection X-Rays
- Tunnel Gap Imaging Investigation of Voltage Dependence of Molecular Images Obtained by Scanning Tunneling Microscope
- High-Performance Current-Voltage Measurement System for Scanning Tunneling Spectroscopy of Deposited Molecules
- Turnnel Gap Imaging Study of Highly Oriented Pyrolytic Graphite Using Scanning Tunneling Microscope
- Effect of The Boundary of the Interface on the Oscillation Mode in the Three-Phases Liquid Membrane System
- Investigation of Molybdenum Disulphide Using a Scanning Tunneling Microscope under Irradiation of Monochromated UV-VIS
- Construction of a Novel Chemical Model for the Nerve Transmission System Using Self-Oscillating Multi-Phases Liquid Membrane System
- Barrier Height Imaging Investigation of Liquid Crystal Molecules Adsorbed on Graphite
- Spectro-Diffractometry for Chemical-State Analysis Based on In-Advance Simulations
- In-Advance Simulation and Chemical State Analysis by Spectro-Diffractometry
- Possibility of the Discrimination of Different Chemical States by Energy-Dispersive X-Ray Spectroscopy
- Site-Selective Chemical State Analysis for Magnetite Structure Using Powder Spectro-Diffractometry (Proceedings of the Second International Conference on SRMS(Synchrotron Radiation in Materials Science)(2))