Direct ICP-AES Determination of Trace Impurities in Silicon Dioxide Using Fluorinating Electrothermal Vaporization with Slurry Sampling

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概要

• 論文の詳細を見る
• Japan Society for Analytical Chemistryの論文
• 1997-08-10

著者

• Peng T

  Kyoto Univ. Kyoto

• Peng Tianyou

  Department Of Materials Chemistry Kyoto University

• Jiang Z

  Guangxi Normal Univ. Guilin Chn

• Jiang Zucheng

  Department Of Chemistry Wuhan University

• Peng Tianyon

  Department of Chemistry, Wuhan University

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• In-situ Separation of a Matrix for the Direct Analysis of Zirconium Dioxide Powder by Electrothermal Vaporization ICP-AES with a Polytetrafluoroethylene Slurry Modifier
• Separation/Preconcentration of Lanthanum and Europium by Micro-Column Packed with Immobilized 1-Phenyl-3-methyl-4-bonzoyl-5-pyrazone on Microcrystalline Naphthalene and Determination by Electrothermal Vaporization Inductively Coupled Plasma-Atomic Emissio
• Direct ICP-AES Determination of Trace Impurities in Silicon Dioxide Using Fluorinating Electrothermal Vaporization with Slurry Sampling
• Direct Analysis of Trace Rare Earth Elements by Fluorination Assisted ETV-ICP-AES with Slurry Sampling through Nano-Sized TiO_2 Separation/Preconcentration
• Determination of Rare Earth Impurities in High-purity Lanthanum Oxide Using Electrothermal Vaporization/ICP-AES after HPLC Separation
• Adsorption Behavior of Noble Metal Ions (Au, Ag, Pd) on Nanometer-size Titanium Dioxide with ICP-AES

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