X-Ray Fluorescence and Reflectivity Analysis of Multiple-Layer Thin Films

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概要

• 論文の詳細を見る
• 1995-07-10

著者

• Huang T

  Ibm Research Division Almaden Research Center

• HUANG Ting

  IBM Research Division, Almaden Research Center

• LEE Wen

  IBM Research Division, Almaden Research Center

関連論文

• Characterization of Electron Superconducting and Related Nd_M_xCuO_ (M=Ce and Th) Compounds
• X-Ray Fluorescence and Reflectivity Analysis of Multiple-Layer Thin Films

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